Failure analysis of ICs requires a quick and proper response because, of course, helping a customer is our main concern. But should we expect the quality assurance (QA) department to test every ...
Defect correlation analysis is a new approach in IC failure analysis technology. Proper failure analysis can provide useful and cost-saving data for companies in control of their design and ...
Suited for carrier-class telecom and high-end computing systems, the IR5001S active ORing controller IC uses an external MOSFET to provide power dissipation of 0.37 W. The part achieves a 130-ns ...
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